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Research and Markets: Single Event Effects in Aerospace - understanding the causes of performance errors and catastrophic failures to electronics devices

Dépèche transmise le 22 novembre 2011 par Business Wire

Research and Markets: Single Event Effects in Aerospace - understanding the causes of performance errors and catastrophic failures to electronics devices

DUBLIN--(BUSINESS WIRE)--Research and Markets (http://www.researchandmarkets.com/research/b458f3/single_event_effec) has announced the addition of John Wiley and Sons Ltd's new book "Single Event Effects in Aerospace" to their offering.

This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment.

The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Key Topics Covered:

• Introduction.
• Foundation of Single Event Analysis and Prediction.
• Optimizing Heavy Ion Experiments for Analysis.
• Data Qualification and Interpretation.
• Analysis of various types of SEU data.
• Cosmic Ray Single Event Rate Calculations.
• Proton Single Event Rate Calculations.
• Neutron induced upset.
• Upsets produced by heavy ion nuclear reactions.
• Samples of Heavy Ion Rate Prediction.
• Samples of Proton rate predictions.
• Combined Environments.
• Samples of Solar events and extreme situations.
• Upset Rates in Neutral Particle Beam (NPB) environments.
• Predictions and Observations of SEU Rates in Space.
• Limitations of the IRPP approach.

Author:

EDWARD PETERSEN, PhD, worked for the Naval Research Laboratory from 1969 to 1993. Since then, he has served as a consultant. Dr. Petersen's research has focused on estimating upset rates for satellite systems. His work has shown that measurements of space upset rates are consistent with predictions based on laboratory experiments. He has authored or coauthored sixty papers on radiation effects, the majority dealing with single event effects. An IEEE Fellow, Dr. Petersen was the recipient of the IEEE Nuclear and Plasma Sciences Society Radiation Effects Award.

For more information visit http://www.researchandmarkets.com/research/b458f3/single_event_effec